ASIC Design made Easy and Cheap

ASIC Test

As a result of wafer or component test in ASIC production, the test machine produces thousands of tonnes measurement results. But the engineer needs a short report, may be with histogram, to rise the yield and improve the design.

With the formulas in this paper, the engineer can import the test results to Open Office spreadsheet and calculate the average, standard deviation and CPK values. These results are the base to find the right screw to improve the yield.

HOWTO analyse test results with Open Office spreadsheet

Download the paper in PDF: HOWTO_ASIC_Test_Results.pdf

And example spreadsheet with all the formulas: ASIC_Test_Results.sxc.

peter(at)easy-asic(dot)de
Copyright 2004, 2005 by Peter Kaiser

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